In areas such as high-precision metalworking, accuracy is non-negotiable. This includes the automotive industry and its suppliers, which is in crisis in Germany for a variety of reasons. The industry ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Detecting sub-5nm defects creates huge challenges for chipmakers, challenges that have a direct impact on yield, reliability, and profitability. In addition to being smaller and harder to detect, ...